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ISSN 1551-4897
General
Vol. 20, Issue 4, 2023October 01, 2023 EDT

Factoring Interacting Stress Mechanisms in Design for Reliability of Extreme Environment Power Modules

David Huitink, Whit Vinson, Collin Ruby, Imam Al Razi, David Agogo-Mawuli, Alan Mantooth, Yarui Peng,
Accelerated testingdesign automationdesign for reliabilityinteracting failure mechanismslayout optimizationpower electronics
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/001c.91213
Journal of Microelectronics & Elect Pkg
Huitink, David, Whit Vinson, Collin Ruby, Imam Al Razi, David Agogo-Mawuli, Alan Mantooth, and Yarui Peng. 2023. “Factoring Interacting Stress Mechanisms in Design for Reliability of Extreme Environment Power Modules.” Journal of Microelectronics and Electronic Packaging 20 (4): 107–11. https:/​/​doi.org/​10.4071/​001c.91213.

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