ISSN 1551-4897
Vol. 12, Issue 1, 2015January 01, 2015 EDT
Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth
Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth
Articles in Vol. 12, Issue 1, 2015
Vol. 12, Issue 1, 2015
- Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing BismuthJoseph M. JuarezPolina SnugovskyEva KosibaZohreh BagheriSubramaniam SuthakaranMichael RobinsonJoel HeebinkJeffrey KennedyMarianne Romansky
- Radio Frequency Microelectromechanical System-Platform Based on Silicon-Ceramic Composite SubstratesM. FischerS. GroppJ. NowakB. CapraroR. SommerM. HoffmannJ. Müller
- Development of a Stress Compensation Layer for 3-D Assembly of Thin Pixel ModulesG. ParesT. McMullenS. ToméL. VignoudR. BatesC. Buttar
- Impact of Bath Stability on Electroplated Cu for TSVs in a Controlled EnvironmentAnh NguyenKevin FealeyPeter ReillyGyanaranjan PattanaikAlison GraciasFred WafulaMichael FlynnJack Enloe
- A Resealable, Gas-Tight Packaging Technique for Silicon Microfluidic DevicesLilla Safford SmithGordon D. HoopleJim C. ChengAlbert P. Pisano
- Electrical and Mechanical Investigations on Copper Circuit Paths Coated on Fiber-Reinforced Plastics by Atmospheric Plasma TechnologyRene SchrammThomas ReitbergerJoerg Franke
- Characterization of the Hot-Cutting Defect Generated from Shape Machining of Alumina Green Tape in the Ceramic-Package Manufacturing ProcessChao ZengChunqing WangYanhong TianChunjin HangWei LiuRong An
Juarez, Joseph M., Polina Snugovsky, Eva Kosiba, Zohreh Bagheri, Subramaniam Suthakaran, Michael Robinson, Joel Heebink, Jeffrey Kennedy, and Marianne Romansky. 2015. “Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth.” Journal of Microelectronics and Electronic Packaging 12 (1): 1–28. https://doi.org/10.4071/imaps.441.