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ISSN 1551-4897
General
Vol. 13, Issue 2, 2016April 01, 2016 EDT

A New In-Line Laser-Based Acoustic Technique for Pillar Bump Metrology

Todd W. Murray, Andrew Bakir, David M. Stobbe, Michael J. Kotelyanskii, Robin A. Mair, Manjusha Mehendale, Xueping Ru, Jonathan D. Cohen, Michelle T. Schulberg, Priya Mukundhan, Timothy J. Kryman,
Copper pillar bump stacksacoustic metrologyadvanced packaging
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.501

Articles in Vol. 13, Issue 2, 2016

Vol. 13, Issue 2, 2016
  • Development of an SiC Multichip Phase-Leg Module for High-Temperature and High-Frequency Applications
    Zheng ChenYiying YaoWenli ZhangDushan BoroyevichKhai NgoPaolo MattavelliRolando Burgos
  • Modeling, Design, Fabrication, and Characterization of Ultra-High Bandwidth 3-D Glass Photonic Substrates
    Bruce ChouWilliam VisRyuta FuruyaVenky SundaramRao Tummala
  • A New In-Line Laser-Based Acoustic Technique for Pillar Bump Metrology
    Todd W. MurrayAndrew BakirDavid M. StobbeMichael J. KotelyanskiiRobin A. MairManjusha MehendaleXueping RuJonathan D. CohenMichelle T. SchulbergPriya MukundhanTimothy J. Kryman
  • Packaging Architecture for an Implanted System that Monitors Brain Activity and Applies Therapeutic Stimulation
    Caroline K. BjuneThomas F. MarinisTirunelveli S. SriramJeanne M. BradyJames MoranPhilip D. ParksAlik S. WidgeDarin D. DoughertyEmad N. Eskandar
  • Heterogeneous Integration of a 300-mm Silicon Photonics-CMOS Wafer Stack by Direct Oxide Bonding and Via-Last 3-D Interconnection
    Colin McDonoughDoug La TulipeDan PascualPaul TarielloJohn MucciMatt SmalleyAnh NguyenTuan VoCorbet JohnsonPhung NguyenJeremiah HebdingGerald LeakeMichele MorescErman TimurdoganVladimir StojanovićMichael R. WattsDouglas Coolbaugh
Journal of Microelectronics & Elect Pkg
Murray, Todd W., Andrew Bakir, David M. Stobbe, Michael J. Kotelyanskii, Robin A. Mair, Manjusha Mehendale, Xueping Ru, et al. 2016. “A New In-Line Laser-Based Acoustic Technique for Pillar Bump Metrology.” Journal of Microelectronics and Electronic Packaging 13 (2): 58–63. https://doi.org/10.4071/imaps.501.
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