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Journal of Microelectronics & Elect Pkg
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ISSN 1551-4897
General
Vol. 9, Issue 1, 2012January 01, 2012 EDT

Molding Flow Modeling and Experimental Study on Void Control for Flip Chip Package Panel Molding with Molded Underfill Technology

Jonathan Tamil, Siew Hoon Ore, Kian Yeow Gan, Drake Koh, Michael Gantalao Ti In, Boon Pek Liew, Teck Wah Park, Geraldine Ng, Yong Bo Yang, Daniel Teh, Nathapong Suthiwongsunthorn, Surasit Chungpaiboonpatana,
flip chipMUFsimulationvoid
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.319

Articles in Vol. 9, Issue 1, 2012

Vol. 9, Issue 1, 2012
  • Molding Flow Modeling and Experimental Study on Void Control for Flip Chip Package Panel Molding with Molded Underfill Technology
    Jonathan TamilSiew Hoon OreKian Yeow GanDrake KohMichael Gantalao Ti InBoon Pek LiewTeck Wah ParkGeraldine NgYong Bo YangDaniel TehNathapong SuthiwongsunthornSurasit Chungpaiboonpatana
  • Reflection Phase Shift for PWB and PCBA Production Testing
    Abdelghani RenbiJerker Delsing
  • Oxide Liner, Barrier and Seed Layers, and Cu Plating of Blind Through Silicon Vias (TSVs) on 300 mm Wafers for 3D IC Integration
    Chien-Ying WuShang-Chun ChenPei-Jer TzengJohn H. LauYi-Feng HsuJui-Chin ChenYu-Chen HsinChien-Chou ChenShang-Hung ShenCha-Hsin LinTzu-Kun KuMing-Jer Kao
  • Quantitative Assessment of the Effects of Strain on Future III-V Digital Applications
    Umesh P. GomesKumud RanjanSubhra ChowdhuryPalash DasServin RathiDhrubes Biswas
  • Design and Characterization of a Biocompatible Packaging Concept for Implantable Electronic Devices
    Maaike Op de BeeckKaren QianPaolo FioriniKarl MalachowskiChris Van Hoof
  • Use of Wafer Applied Underfill for 3D Stacking
    Antonio La MannaK. J. RebibisC. GeretsE. Beyne
Journal of Microelectronics & Elect Pkg
Tamil, Jonathan, Siew Hoon Ore, Kian Yeow Gan, Drake Koh, Michael Gantalao Ti In, Boon Pek Liew, Teck Wah Park, et al. 2012. “Molding Flow Modeling and Experimental Study on Void Control for Flip Chip Package Panel Molding with Molded Underfill Technology.” Journal of Microelectronics and Electronic Packaging 9 (1): 19–30. https://doi.org/10.4071/imaps.319.
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