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Vol. 15, Issue 3, 2018July 01, 2018 EDT

Reliability of Novel Ceramic Encapsulation Materials for Electronic Packaging

Stefan Kaessner, Markus G. Scheibel, Stefan Behrendt, Bianca Boettge, Christoph Berthold, Klaus G. Nickel,
Ceramic encapsulationreliabilitychip surface interactionharsh environmentelectronic packaging
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.661015
Journal of Microelectronics & Elect Pkg
Kaessner, Stefan, Markus G. Scheibel, Stefan Behrendt, Bianca Boettge, Christoph Berthold, and Klaus G. Nickel. 2018. “Reliability of Novel Ceramic Encapsulation Materials for Electronic Packaging.” Journal of Microelectronics and Electronic Packaging 15 (3): 132–39. https:/​/​doi.org/​10.4071/​imaps.661015.
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