ISSN 1551-4897
Vol. 18, Issue 1, 2021January 01, 2021 EDT
Impact of Die Attach Sample Preparation on Its Measured Mechanical Properties for MEMS Sensor Applications
Impact of Die Attach Sample Preparation on Its Measured Mechanical Properties for MEMS Sensor Applications
Abel Misrak, Tushar Chauhan, Rabin Bhandari, A S M Raufur Chowdhury, Akshay Lakshminarayana, Fahad Mirza, B. Gholami Bazehhour, Milena Vujosevic, Dereje Agonafer,
Articles in Vol. 18, Issue 1, 2021
Vol. 18, Issue 1, 2021
- Electromigration in Power Devices: A Combined Effect of Electromigration and Thermal MigrationHao ZhuangRobert BauerMarkus Dinkel
- A Novel Method for Characterization of Ultralow Viscosity NCF Layers Using TCB for 3D AssemblyGiovanni CapuzMelina LofranoCarine GeretsFabrice DuvalPieter BexJaber DerakhshandehKris VanstreelsAlain PhommahaxayEric BeyneAndy Miller
- Impact of Die Attach Sample Preparation on Its Measured Mechanical Properties for MEMS Sensor ApplicationsAbel MisrakTushar ChauhanRabin BhandariA S M Raufur ChowdhuryAkshay LakshminarayanaFahad MirzaB. Gholami BazehhourMilena VujosevicDereje Agonafer
- Optimization of High-Speed Electrolytic Plating of Copper Pillar to Achieve a Flat Top Morphology and Height UniformityRaihei IkumotoYuki ItakuraShinji TachibanaHisamitsu Yamamoto
Misrak, Abel, Tushar Chauhan, Rabin Bhandari, A S M Raufur Chowdhury, Akshay Lakshminarayana, Fahad Mirza, B. Gholami Bazehhour, Milena Vujosevic, and Dereje Agonafer. 2021. “Impact of Die Attach Sample Preparation on Its Measured Mechanical Properties for MEMS Sensor Applications.” Journal of Microelectronics and Electronic Packaging 18 (1): 21–28. https://doi.org/10.4071/imaps.1234982.